Scanning Probe Microscopy (SPM) - is a powerful technique that allows to study materials surfaces at nanometre scale. SPM can not only image the surface in atomic resolution but also measure the force at nano- Newton scale.
SPM is a family of -
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AFM (SFFM for friction properties, MFM for magnetic properties, EFM for electrostatic properties. KPM..)
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STM
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SNOM
Basic AFM consists of -
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Cantilever
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Piezoelectric scanner
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Beam deflection mechanism
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Electronic Control unit
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Digital signal processor
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Acquisition & data processing software
Various SPM measurement modes are available like-
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Contact ( not oscillating)
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Dynamic ( Oscillating)
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Jumping
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3D mode
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Plane scan & retrace modes etc..
Measurement can be done various environmental conditions like -
